gptkbp:instanceOf
|
electronic test standard
|
gptkbp:alsoKnownAs
|
gptkb:JTAG
|
gptkbp:appliesTo
|
printed circuit boards
digital integrated circuits
|
gptkbp:category
|
gptkb:standard
electronics
test engineering
|
gptkbp:defines
|
gptkb:Data_Register
gptkb:TAP_controller
gptkb:Test_Access_Port_(TAP)
gptkb:Boundary-Scan_Register
gptkb:Instruction_Register
|
gptkbp:enables
|
fault isolation
test automation
device programming
|
gptkbp:firstPublished
|
1990
|
gptkbp:focusesOn
|
boundary-scan architecture
|
gptkbp:hasComponent
|
gptkb:TCK_(Test_Clock)
gptkb:TDI_(Test_Data_In)
gptkb:TDO_(Test_Data_Out)
gptkb:TMS_(Test_Mode_Select)
gptkb:TRST_(Test_Reset,_optional)
|
https://www.w3.org/2000/01/rdf-schema#label
|
IEEE 1149.1 standard
|
gptkbp:publishedBy
|
gptkb:Institute_of_Electrical_and_Electronics_Engineers
|
gptkbp:relatedStandard
|
gptkb:IEEE_1149.4
gptkb:IEEE_1149.6
gptkb:IEEE_1149.7
|
gptkbp:updated
|
gptkb:IEEE_1149.1-1994
gptkb:IEEE_1149.1-2001
gptkb:IEEE_1149.1-2013
|
gptkbp:usedFor
|
in-system programming
debugging integrated circuits
testing printed circuit boards
|
gptkbp:bfsParent
|
gptkb:TAP_controller
|
gptkbp:bfsLayer
|
6
|