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gptkbp:instanceOf
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gptkb:electronic_test_standard
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gptkbp:alsoKnownAs
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gptkb:JTAG
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gptkbp:appliesTo
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printed circuit boards
digital integrated circuits
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gptkbp:category
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gptkb:standard
electronics
test engineering
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gptkbp:defines
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gptkb:Data_Register
gptkb:TAP_controller
gptkb:Test_Access_Port_(TAP)
gptkb:Boundary-Scan_Register
gptkb:Instruction_Register
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gptkbp:enables
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fault isolation
test automation
device programming
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gptkbp:firstPublished
|
1990
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gptkbp:focusesOn
|
boundary-scan architecture
|
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gptkbp:hasComponent
|
gptkb:TCK_(Test_Clock)
gptkb:TDI_(Test_Data_In)
gptkb:TDO_(Test_Data_Out)
gptkb:TMS_(Test_Mode_Select)
gptkb:TRST_(Test_Reset,_optional)
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|
gptkbp:publishedBy
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gptkb:Institute_of_Electrical_and_Electronics_Engineers
|
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gptkbp:relatedStandard
|
gptkb:IEEE_1149.4
gptkb:IEEE_1149.6
gptkb:IEEE_1149.7
|
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gptkbp:updated
|
gptkb:IEEE_1149.1-1994
gptkb:IEEE_1149.1-2001
gptkb:IEEE_1149.1-2013
|
|
gptkbp:usedFor
|
in-system programming
debugging integrated circuits
testing printed circuit boards
|
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gptkbp:bfsParent
|
gptkb:TAP_controller
|
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gptkbp:bfsLayer
|
6
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https://www.w3.org/2000/01/rdf-schema#label
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IEEE 1149.1 standard
|