Statements (23)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:alsoKnownAs |
gptkb:JTAG
|
| gptkbp:appliesTo |
integrated circuits
printed circuit boards |
| gptkbp:category |
electronic design automation
hardware testing |
| gptkbp:defines |
gptkb:Test_Access_Port_(TAP)
gptkb:Boundary-Scan_Register data register instruction register |
| gptkbp:field |
boundary scan
electronic test |
| gptkbp:fullName |
IEEE Standard for Test Access Port and Boundary-Scan Architecture
|
| https://www.w3.org/2000/01/rdf-schema#label |
IEEE 1149.1-2013
|
| gptkbp:publicationYear |
2013
|
| gptkbp:publishedBy |
gptkb:Institute_of_Electrical_and_Electronics_Engineers
|
| gptkbp:purpose |
enable debugging
enable in-system programming facilitate testing of interconnects |
| gptkbp:replacedBy |
IEEE 1149.1-2013/Cor 1-2014
|
| gptkbp:updated |
gptkb:IEEE_1149.1-2001
|
| gptkbp:bfsParent |
gptkb:IEEE_1149.1_standard
|
| gptkbp:bfsLayer |
7
|