Statements (19)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:International_Standard
|
| gptkbp:adoptedBy |
1999
|
| gptkbp:alsoKnownAs |
gptkb:Mixed-Signal_Test_Bus
|
| gptkbp:defines |
test access port
test bus architecture |
| gptkbp:focusesOn |
testability
mixed-signal circuits analog and digital signals |
| gptkbp:fullName |
gptkb:IEEE_Standard_for_a_Mixed-Signal_Test_Bus
|
| https://www.w3.org/2000/01/rdf-schema#label |
IEEE 1149.4
|
| gptkbp:partOf |
gptkb:IEEE_1149_family
|
| gptkbp:publishedBy |
gptkb:Institute_of_Electrical_and_Electronics_Engineers
|
| gptkbp:relatedTo |
gptkb:IEEE_1149.1
|
| gptkbp:status |
active
|
| gptkbp:usedFor |
board-level testing
testing integrated circuits |
| gptkbp:website |
https://standards.ieee.org/standard/1149_4-1999.html
|
| gptkbp:bfsParent |
gptkb:IEEE_1149.1
|
| gptkbp:bfsLayer |
4
|