Statements (15)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:International_Standard
|
| gptkbp:appliesTo |
high-speed digital circuits
|
| gptkbp:category |
test access port and boundary-scan architecture
|
| gptkbp:extendsTo |
gptkb:IEEE_1149.1
|
| gptkbp:firstPublished |
2003
|
| gptkbp:focusesOn |
testing of advanced digital networks
|
| gptkbp:fullName |
gptkb:IEEE_Standard_for_Boundary-Scan_Testing_of_Advanced_Digital_Networks
|
| https://www.w3.org/2000/01/rdf-schema#label |
IEEE 1149.6
|
| gptkbp:partOf |
gptkb:IEEE_1149_family
|
| gptkbp:publishedBy |
gptkb:Institute_of_Electrical_and_Electronics_Engineers
|
| gptkbp:standardNumber |
1149.6
|
| gptkbp:status |
active
|
| gptkbp:usedFor |
testing AC-coupled and high-speed differential interconnects
|
| gptkbp:bfsParent |
gptkb:IEEE_1149.1
|
| gptkbp:bfsLayer |
4
|