Statements (33)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
digital circuit component
|
| gptkbp:controls |
gptkb:JTAG_state_machine
instruction register test data registers |
| gptkbp:definedIn |
gptkb:IEEE_1149.1_standard
|
| gptkbp:fullName |
Test Access Port controller
|
| gptkbp:function |
controls access to test logic in JTAG
|
| https://www.w3.org/2000/01/rdf-schema#label |
TAP controller
|
| gptkbp:includesState |
gptkb:Capture-DR
gptkb:Exit1-DR gptkb:Exit2-DR gptkb:Pause-DR gptkb:Select-DR-Scan gptkb:Shift-DR Capture-IR Exit1-IR Exit2-IR Pause-IR Run-Test/Idle Select-IR-Scan Shift-IR Test-Logic-Reset Update-DR Update-IR |
| gptkbp:input |
gptkb:TCK
gptkb:TMS gptkb:TRST |
| gptkbp:usedFor |
boundary scan
device testing debugging integrated circuits |
| gptkbp:usedIn |
gptkb:JTAG
|
| gptkbp:bfsParent |
gptkb:IEEE_Standard_Test_Access_Port_and_Boundary-Scan_Architecture
|
| gptkbp:bfsLayer |
5
|