|
gptkbp:instance_of
|
gptkb:standard
|
|
gptkbp:bfsLayer
|
6
|
|
gptkbp:bfsParent
|
gptkb:IEEE_1149.1
|
|
gptkbp:addresses
|
Interconnect testing
|
|
gptkbp:applies_to
|
Integrated Circuits
|
|
gptkbp:defines
|
Test access mechanisms
|
|
gptkbp:developed_by
|
gptkb:IEEE_Standards_Association
gptkb:API
|
|
gptkbp:enables
|
System-on-chip testing
|
|
gptkbp:enhances
|
Manufacturing test
|
|
gptkbp:facilitates
|
Debugging
|
|
https://www.w3.org/2000/01/rdf-schema#label
|
IEEE 1149.7
|
|
gptkbp:improves
|
Boundary-scan testing
|
|
gptkbp:includes
|
Test data compression
|
|
gptkbp:is_adopted_by
|
Semiconductor manufacturers
|
|
gptkbp:is_compatible_with
|
gptkb:IEEE_1149.1
IEEE 1149.6
|
|
gptkbp:is_documented_in
|
IEEE standards documentation
|
|
gptkbp:is_implemented_in
|
gptkb:football_match
gptkb:API
|
|
gptkbp:is_influenced_by
|
Previous IEEE standards
|
|
gptkbp:is_part_of
|
gptkb:IEEE_1149_family
Test strategy
Design for testability
Test access architecture
|
|
gptkbp:is_recognized_by
|
gptkb:International_Electrotechnical_Commission
|
|
gptkbp:is_related_to
|
JTAG
|
|
gptkbp:is_supported_by
|
Test equipment manufacturers
|
|
gptkbp:is_used_for
|
Device programming
Fault isolation
In-system testing
|
|
gptkbp:is_used_in
|
Electronic design automation
|
|
gptkbp:is_utilized_in
|
gptkb:Io_T_devices
gptkb:robot
gptkb:Telecommunications_company
Aerospace systems
Consumer electronics
Medical devices
Industrial automation
Smart devices
Military applications
Automotive electronics
|
|
gptkbp:provides
|
Boundary-scan control
Enhanced test capabilities
|
|
gptkbp:published_by
|
gptkb:2015
|
|
gptkbp:related_to
|
Test Access Port and Boundary-Scan Architecture
|
|
gptkbp:supports
|
Low-power testing
|