Statements (27)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:electronic_test_protocol
|
| gptkbp:category |
gptkb:debugger
gptkb:personal_computer gptkb:industrial_equipment |
| gptkbp:developedBy |
gptkb:Joint_Test_Action_Group
|
| gptkbp:fullName |
gptkb:Joint_Test_Action_Group
|
| gptkbp:hasPINCode |
gptkb:TCK
gptkb:TDI gptkb:TDO gptkb:TMS gptkb:TRST |
| gptkbp:introducedIn |
1985
|
| gptkbp:relatedStandard |
gptkb:IEEE_1149.7
gptkb:IEEE_1532 |
| gptkbp:standardizedBy |
gptkb:IEEE_1149.1
|
| gptkbp:supports |
boundary scan
hardware debugging in-system programming |
| gptkbp:usedBy |
gptkb:FPGA
microcontrollers microprocessors |
| gptkbp:usedFor |
debugging embedded systems
programming microcontrollers testing printed circuit boards |
| gptkbp:bfsParent |
gptkb:IEEE_1149.1
|
| gptkbp:bfsLayer |
4
|
| https://www.w3.org/2000/01/rdf-schema#label |
JTAG
|