Statements (18)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:alsoKnownAs |
gptkb:JTAG
|
| gptkbp:appliesTo |
electronic circuit testing
|
| gptkbp:category |
electronics standard
|
| gptkbp:defines |
Test Access Port
Boundary-Scan Architecture |
| gptkbp:fullName |
gptkb:IEEE_Standard_Test_Access_Port_and_Boundary-Scan_Architecture
|
| https://www.w3.org/2000/01/rdf-schema#label |
IEEE 1149.1-1994
|
| gptkbp:partOfSeries |
gptkb:IEEE_1149.1
|
| gptkbp:publicationYear |
1994
|
| gptkbp:publishedBy |
gptkb:Institute_of_Electrical_and_Electronics_Engineers
|
| gptkbp:replacedBy |
gptkb:IEEE_1149.1-2001
IEEE 1149.1-1990 |
| gptkbp:usedFor |
debugging embedded systems
in-system programming testing interconnects on printed circuit boards |
| gptkbp:bfsParent |
gptkb:IEEE_1149.1_standard
|
| gptkbp:bfsLayer |
7
|