Statements (17)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:alsoKnownAs |
gptkb:JTAG
|
| gptkbp:appliesTo |
digital circuits
|
| gptkbp:defines |
gptkb:Test_Access_Port_(TAP)
Boundary-Scan Architecture |
| gptkbp:field |
electronics
|
| gptkbp:fullName |
gptkb:IEEE_Standard_Test_Access_Port_and_Boundary-Scan_Architecture
|
| https://www.w3.org/2000/01/rdf-schema#label |
IEEE 1149.1-2001
|
| gptkbp:publicationYear |
2001
|
| gptkbp:publishedBy |
gptkb:Institute_of_Electrical_and_Electronics_Engineers
|
| gptkbp:replacedBy |
gptkb:IEEE_1149.1-2013
|
| gptkbp:updated |
IEEE 1149.1-1990
|
| gptkbp:usedFor |
debugging embedded systems
in-system programming testing integrated circuits |
| gptkbp:bfsParent |
gptkb:IEEE_1149.1_standard
|
| gptkbp:bfsLayer |
7
|