Statements (50)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Scanning Probe Microscopy Technique
|
| gptkbp:abbreviation |
gptkb:MFM
|
| gptkbp:advantage |
High spatial resolution
Operates in various environments Surface sensitivity |
| gptkbp:canMap |
Magnetic domain structures
Magnetic field gradients Magnetic stray fields |
| gptkbp:combines |
gptkb:Conductive_AFM
gptkb:Electrostatic_force_microscopy gptkb:Kelvin_probe_force_microscopy |
| gptkbp:detects |
Bit patterns in hard drives
Magnetic domain walls Magnetic vortices Stray magnetic fields |
| gptkbp:developedBy |
1980s
|
| https://www.w3.org/2000/01/rdf-schema#label |
Magnetic Force Microscopy
|
| gptkbp:inventedBy |
gptkb:H.K._Wickramasinghe
gptkb:Y._Martin |
| gptkbp:isNonDestructive |
true
|
| gptkbp:limitation |
Limited quantitative analysis
Resolution limited by tip size Tip-induced perturbation |
| gptkbp:measures |
Magnetic forces
|
| gptkbp:operatesIn |
gptkb:vacuum
Low temperature Ambient conditions |
| gptkbp:publicationYear |
1987
|
| gptkbp:publishedIn |
gptkb:Applied_Physics_Letters
|
| gptkbp:relatedTo |
gptkb:Atomic_Force_Microscopy
gptkb:Electron_holography gptkb:Lorentz_microscopy gptkb:Magnetoresistive_force_microscopy |
| gptkbp:requires |
Sample preparation
Magnetic shielding Vibration isolation |
| gptkbp:resolution |
Nanometer scale
|
| gptkbp:signature |
Antiferromagnetic materials
Ferromagnetic materials Superparamagnetic materials |
| gptkbp:usedFor |
Imaging magnetic domains
Measuring magnetic properties |
| gptkbp:usedIn |
Nanotechnology
Material science Data storage research |
| gptkbp:uses |
Cantilever
Laser detection system Magnetic tip |
| gptkbp:bfsParent |
gptkb:MFM
|
| gptkbp:bfsLayer |
6
|