Kelvin probe force microscopy
GPTKB entity
Statements (26)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
scanning probe microscopy technique
|
| gptkbp:abbreviation |
KPFM
|
| gptkbp:application |
semiconductor research
organic electronics corrosion science solar cell characterization |
| gptkbp:basedOn |
gptkb:atomic_force_microscopy
|
| gptkbp:category |
gptkb:nanotechnology
surface science |
| gptkbp:detects |
electrostatic forces
|
| https://www.w3.org/2000/01/rdf-schema#label |
Kelvin probe force microscopy
|
| gptkbp:introducedIn |
1991
|
| gptkbp:inventedBy |
Nonnenmacher, O'Boyle, and Wickramasinghe
|
| gptkbp:measures |
contact potential difference
|
| gptkbp:operatesIn |
gptkb:vacuum
ambient conditions controlled atmosphere |
| gptkbp:relatedTo |
gptkb:Kelvin_probe
gptkb:scanning_Kelvin_probe_microscopy |
| gptkbp:resolution |
nanometer scale
|
| gptkbp:usedFor |
mapping work function
measuring surface potential |
| gptkbp:uses |
conductive AFM tip
|
| gptkbp:bfsParent |
gptkb:Atomic_Force_Microscopy
gptkb:Magnetic_Force_Microscopy |
| gptkbp:bfsLayer |
7
|