Statements (52)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
microscopy technique
|
| gptkbp:abbreviation |
gptkb:AFM
|
| gptkbp:alternativeTo |
electron microscopy
optical microscopy |
| gptkbp:detects |
electrical properties
magnetic properties topography mechanical properties |
| gptkbp:enables |
gptkb:magnetic_force_microscopy
gptkb:nanolithography gptkb:Kelvin_probe_force_microscopy surface modification chemical force microscopy conductive AFM current sensing electrostatic force microscopy force mapping friction force microscopy phase imaging scanning capacitance microscopy scanning near-field optical microscopy scanning thermal microscopy single-molecule force spectroscopy |
| https://www.w3.org/2000/01/rdf-schema#label |
Atomic Force Microscopy
|
| gptkbp:introducedIn |
1986
|
| gptkbp:inventedBy |
gptkb:Gerd_Binnig
gptkb:Calvin_Quate gptkb:Christoph_Gerber |
| gptkbp:limitation |
limited scan size
slow scan speed tip wear sample damage |
| gptkbp:measures |
force between tip and sample
|
| gptkbp:operatesIn |
contact mode
non-contact mode tapping mode |
| gptkbp:relatedTo |
gptkb:Scanning_Tunneling_Microscopy
|
| gptkbp:requires |
laser deflection system
piezoelectric scanner |
| gptkbp:resolution |
atomic scale
|
| gptkbp:signature |
conductive samples
insulating samples |
| gptkbp:usedFor |
imaging surfaces at the nanoscale
manipulating atoms and molecules measuring surface forces |
| gptkbp:usedIn |
gptkb:nanotechnology
biology materials science surface science |
| gptkbp:uses |
cantilever with sharp tip
|
| gptkbp:bfsParent |
gptkb:Near-field_Scanning_Optical_Microscopy
|
| gptkbp:bfsLayer |
6
|