Statements (54)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:scientific_experiments
|
| gptkbp:analyzes |
mechanical properties
electrical properties |
| gptkbp:can_be_used_in |
vacuum environments
liquid environments |
| gptkbp:can_detect |
surface defects
|
| gptkbp:can_provide |
3 D surface profiles
|
| gptkbp:developed_by |
gptkb:Gerd_Binnig
gptkb:1986 |
| gptkbp:has_applications_in |
gptkb:Company
biomedical research polymer science |
| gptkbp:has_limitations |
sample damage
tip wear scan speed |
| https://www.w3.org/2000/01/rdf-schema#label |
Atomic Force Microscopy
|
| gptkbp:is_analyzed_in |
elasticity
adhesion forces viscoelastic properties |
| gptkbp:is_fundamental_to |
surface science
material characterization nanotechnology research |
| gptkbp:is_influenced_by |
environmental conditions
sample properties tip characteristics |
| gptkbp:is_part_of |
industrial applications
academic studies research laboratories scanning probe techniques |
| gptkbp:is_studied_for |
biomolecules
thin films nanostructures |
| gptkbp:is_used_in |
catalysis research
coating analysis drug delivery research |
| gptkbp:measures |
surface roughness
topography molecular interactions |
| gptkbp:operated_by |
gptkb:engineers
gptkb:scientists |
| gptkbp:principle_of_operation |
scanning probe microscopy
|
| gptkbp:provides |
high-resolution images
|
| gptkbp:related_products |
optical microscopy
electron microscopy |
| gptkbp:requires |
cantilever
tip |
| gptkbp:resolution |
nanometers
|
| gptkbp:used_for |
imaging surfaces
measuring forces |
| gptkbp:used_in |
gptkb:nanotechnology
materials science biophysics |
| gptkbp:bfsParent |
gptkb:Molecular_Biophysics_Unit,_Indian_Institute_of_Science
|
| gptkbp:bfsLayer |
6
|