Electrostatic force microscopy
GPTKB entity
Statements (21)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
scanning probe microscopy technique
|
| gptkbp:abbreviation |
gptkb:EFM
|
| gptkbp:application |
semiconductor characterization
dielectric material analysis nanostructure analysis |
| gptkbp:category |
gptkb:nanotechnology
materials science surface science |
| gptkbp:detects |
surface charge distribution
work function variations |
| gptkbp:developedBy |
1990s
|
| https://www.w3.org/2000/01/rdf-schema#label |
Electrostatic force microscopy
|
| gptkbp:measures |
electrostatic interactions
|
| gptkbp:operatesIn |
non-contact mode
|
| gptkbp:relatedTo |
gptkb:atomic_force_microscopy
gptkb:Kelvin_probe_force_microscopy |
| gptkbp:usedFor |
mapping surface potential
measuring electrostatic forces |
| gptkbp:uses |
conductive cantilever
|
| gptkbp:bfsParent |
gptkb:Magnetic_Force_Microscopy
|
| gptkbp:bfsLayer |
7
|