Scanning Probe Microscopy

URI: https://gptkb.org/entity/Scanning_Probe_Microscopy
GPTKB entity
Statements (50)
Predicate Object
gptkbp:instanceOf gptkb:Microscopy_technique
gptkbp:abbreviation gptkb:SPM
gptkbp:application Material analysis
Semiconductor industry
Biological imaging
Nanostructure characterization
Surface topography
gptkbp:category gptkb:Imaging_technology
Instrumentation
Analytical chemistry
Surface analysis
gptkbp:detects Chemical properties
Electrical properties
Magnetic properties
Mechanical properties
Surface forces
gptkbp:enables Atomic manipulation
Force measurement
Molecular imaging
Nanoscale imaging
Surface modification
gptkbp:field gptkb:Physics
gptkb:Surface_science
Materials science
Nanotechnology
gptkbp:firstDemonstrated 1981
gptkbp:inventedBy gptkb:Gerd_Binnig
gptkb:Heinrich_Rohrer
1980s
gptkbp:limitation Environmental sensitivity
Limited scan area
Sample preparation requirements
Slow scanning speed
Tip wear
gptkbp:notableLaboratory gptkb:IBM_Zurich_Research_Laboratory
gptkbp:notableWinner gptkb:Nobel_Prize_in_Physics_1986
gptkbp:principle Scanning a sharp probe over a surface
gptkbp:relatedTo gptkb:Electron_Microscopy
gptkb:Optical_Microscopy
gptkbp:resolution Atomic scale
gptkbp:type gptkb:Atomic_Force_Microscopy
gptkb:Scanning_Tunneling_Microscopy
gptkb:Near-field_Scanning_Optical_Microscopy
gptkb:Magnetic_Force_Microscopy
gptkbp:uses Feedback mechanism
Piezoelectric scanner
Sharp probe
gptkbp:bfsParent gptkb:SPM
gptkbp:bfsLayer 6
https://www.w3.org/2000/01/rdf-schema#label Scanning Probe Microscopy