Statements (50)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Microscopy technique
|
| gptkbp:abbreviation |
gptkb:SPM
|
| gptkbp:application |
Material analysis
Semiconductor industry Biological imaging Nanostructure characterization Surface topography |
| gptkbp:category |
Instrumentation
Imaging technology Analytical chemistry Surface analysis |
| gptkbp:detects |
Chemical properties
Electrical properties Magnetic properties Mechanical properties Surface forces |
| gptkbp:enables |
Atomic manipulation
Force measurement Molecular imaging Nanoscale imaging Surface modification |
| gptkbp:field |
gptkb:Physics
gptkb:Surface_science Materials science Nanotechnology |
| gptkbp:firstDemonstrated |
1981
|
| https://www.w3.org/2000/01/rdf-schema#label |
Scanning Probe Microscopy
|
| gptkbp:inventedBy |
gptkb:Gerd_Binnig
gptkb:Heinrich_Rohrer 1980s |
| gptkbp:limitation |
Environmental sensitivity
Limited scan area Sample preparation requirements Slow scanning speed Tip wear |
| gptkbp:notableLaboratory |
gptkb:IBM_Zurich_Research_Laboratory
|
| gptkbp:notableWinner |
gptkb:Nobel_Prize_in_Physics_1986
|
| gptkbp:principle |
Scanning a sharp probe over a surface
|
| gptkbp:relatedTo |
gptkb:Electron_Microscopy
gptkb:Optical_Microscopy |
| gptkbp:resolution |
Atomic scale
|
| gptkbp:type |
gptkb:Atomic_Force_Microscopy
gptkb:Scanning_Tunneling_Microscopy gptkb:Near-field_Scanning_Optical_Microscopy gptkb:Magnetic_Force_Microscopy |
| gptkbp:uses |
Feedback mechanism
Piezoelectric scanner Sharp probe |
| gptkbp:bfsParent |
gptkb:SPM
|
| gptkbp:bfsLayer |
6
|