Atomic Force Microscope

GPTKB entity

Statements (53)
Predicate Object
gptkbp:instance_of gptkb:scientific_experiments
gptkbp:analyzes biomolecules
thin films
nanoparticles
nanostructures
gptkbp:can_be_combined_with scanning tunneling microscopy
gptkbp:can_be_used_in gptkb:Company
biological research
material science
gptkbp:can_image insulating surfaces
conductive surfaces
gptkbp:can_perform force spectroscopy
gptkbp:developed_by gptkb:Gerd_Binnig
gptkb:1986
gptkbp:has_component gptkb:cosmic_ray_detector
gptkb:optics
cantilever
tip
gptkbp:has_limitations environmental noise
sample size
scan speed
https://www.w3.org/2000/01/rdf-schema#label Atomic Force Microscope
gptkbp:is_available_in commercial models
research-grade models
gptkbp:is_capable_of 3 D imaging
gptkbp:is_part_of gptkb:sports_equipment
scanning probe microscopy
research tools
analytical instruments
gptkbp:is_used_for quality control
failure analysis
adhesion studies
nanomanipulation
surface roughness measurement
gptkbp:is_used_in gptkb:pharmaceuticals
gptkb:nanotechnology
surface chemistry
polymer science
gptkbp:measures force interactions
surface topography
gptkbp:operated_by gptkb:engineers
gptkb:scientists
technicians
gptkbp:operates nanometer scale
gptkbp:provides high-resolution imaging
gptkbp:requires sample preparation
gptkbp:resolution 1 nanometer
gptkbp:sensitivity temperature changes
vibrations
air currents
gptkbp:uses interatomic forces
gptkbp:bfsParent gptkb:scientific_experiments
gptkbp:bfsLayer 4