Statements (52)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
scientific instrument
|
| gptkbp:abbreviation |
gptkb:AFM
|
| gptkbp:alternativeTo |
gptkb:electron_microscope
|
| gptkbp:application |
gptkb:nanotechnology
biology chemistry materials science physics |
| gptkbp:commercialUse |
gptkb:Asylum_Research
gptkb:JPK_Instruments gptkb:Bruker NT-MDT Park Systems |
| gptkbp:component |
gptkb:laser
photodetector piezoelectric scanner cantilever sharp tip |
| gptkbp:enables |
lithography
3D surface profiling force spectroscopy imaging in air imaging in liquid environments imaging in vacuum manipulation of nanoparticles nanoindentation |
| https://www.w3.org/2000/01/rdf-schema#label |
Atomic Force Microscope
|
| gptkbp:introducedIn |
1986
|
| gptkbp:inventedBy |
gptkb:Gerd_Binnig
gptkb:Calvin_Quate gptkb:Christoph_Gerber |
| gptkbp:limitation |
limited scan size
slow scan speed tip wear |
| gptkbp:mode |
contact mode
non-contact mode tapping mode |
| gptkbp:operates |
measuring force between probe and sample
|
| gptkbp:relatedTo |
gptkb:Scanning_Tunneling_Microscope
|
| gptkbp:resolution |
atomic scale
|
| gptkbp:signature |
conductive surfaces
non-conductive surfaces |
| gptkbp:technique |
gptkb:Magnetic_Force_Microscopy
gptkb:Kelvin_Probe_Force_Microscopy gptkb:Conductive_AFM Force Modulation Microscopy Lateral Force Microscopy |
| gptkbp:usedFor |
imaging surfaces at the nanoscale
manipulating atoms and molecules measuring surface forces |
| gptkbp:bfsParent |
gptkb:AFM
|
| gptkbp:bfsLayer |
6
|