Statements (24)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Scanning probe microscopy technique
|
| gptkbp:alsoKnownAs |
C-AFM
|
| gptkbp:appliesTo |
voltage between tip and sample
|
| gptkbp:canMap |
defects in materials
conductivity variations current distribution |
| gptkbp:detects |
current flow through sample
|
| gptkbp:developedBy |
1990s
|
| gptkbp:enables |
nanoscale electrical characterization
current-voltage spectroscopy at nanoscale |
| https://www.w3.org/2000/01/rdf-schema#label |
Conductive AFM
|
| gptkbp:measures |
local electrical conductivity
|
| gptkbp:relatedTo |
gptkb:Kelvin_probe_force_microscopy
Atomic force microscopy Scanning tunneling microscopy |
| gptkbp:requires |
conductive sample or coating
|
| gptkbp:resolution |
nanoscale
|
| gptkbp:usedIn |
gptkb:nanotechnology
material science semiconductor research |
| gptkbp:uses |
conductive probe
|
| gptkbp:bfsParent |
gptkb:Magnetic_Force_Microscopy
gptkb:Atomic_Force_Microscope |
| gptkbp:bfsLayer |
7
|