IEEE Standard Test Access Port and Boundary-Scan Architecture

GPTKB entity

Predicate	Object
gptkbp:instanceOf	gptkb:International_Standard gptkb:technical_specification
gptkbp:alsoKnownAs	gptkb:IEEE_1149.1
gptkbp:appliesTo	digital circuits
gptkbp:category	board-level testing electronic testing hardware debugging
gptkbp:defines	gptkb:JTAG
gptkbp:enables	debugging device programming in-circuit testing
gptkbp:firstPublished	1990
gptkbp:focusesOn	boundary scan test access port
gptkbp:publishedBy	gptkb:Institute_of_Electrical_and_Electronics_Engineers
gptkbp:relatedStandard	gptkb:IEEE_1149.4 gptkb:IEEE_1149.6 gptkb:IEEE_1149.7
gptkbp:specifies	gptkb:Data_Register gptkb:TAP_controller gptkb:Test_Access_Port_(TAP) gptkb:Boundary-Scan_Register gptkb:Instruction_Register
gptkbp:standardNumber	gptkb:IEEE_1149.1
gptkbp:updated	2001 2013 2018
gptkbp:usedFor	testing integrated circuits testing printed circuit boards
gptkbp:bfsParent	gptkb:IEEE_1149.1
gptkbp:bfsLayer	4
https://www.w3.org/2000/01/rdf-schema#label	IEEE Standard Test Access Port and Boundary-Scan Architecture