IEEE Standard Test Access Port and Boundary-Scan Architecture

URI: https://gptkb.org/entity/IEEE_Standard_Test_Access_Port_and_Boundary-Scan_Architecture
GPTKB entity
Statements (32)
Predicate Object
gptkbp:instanceOf gptkb:International_Standard
gptkb:technical_specification
gptkbp:alsoKnownAs gptkb:IEEE_1149.1
gptkbp:appliesTo digital circuits
gptkbp:category board-level testing
electronic testing
hardware debugging
gptkbp:defines gptkb:JTAG
gptkbp:enables debugging
device programming
in-circuit testing
gptkbp:firstPublished 1990
gptkbp:focusesOn boundary scan
test access port
https://www.w3.org/2000/01/rdf-schema#label IEEE Standard Test Access Port and Boundary-Scan Architecture
gptkbp:publishedBy gptkb:Institute_of_Electrical_and_Electronics_Engineers
gptkbp:relatedStandard gptkb:IEEE_1149.4
gptkb:IEEE_1149.6
gptkb:IEEE_1149.7
gptkbp:specifies gptkb:Data_Register
gptkb:TAP_controller
gptkb:Test_Access_Port_(TAP)
gptkb:Boundary-Scan_Register
gptkb:Instruction_Register
gptkbp:standardNumber gptkb:IEEE_1149.1
gptkbp:updated 2001
2013
2018
gptkbp:usedFor testing integrated circuits
testing printed circuit boards
gptkbp:bfsParent gptkb:IEEE_1149.1
gptkbp:bfsLayer 4