IEEE Standard Test Access Port and Boundary-Scan Architecture
GPTKB entity
Statements (32)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:International_Standard
gptkb:technical_specification |
| gptkbp:alsoKnownAs |
gptkb:IEEE_1149.1
|
| gptkbp:appliesTo |
digital circuits
|
| gptkbp:category |
board-level testing
electronic testing hardware debugging |
| gptkbp:defines |
gptkb:JTAG
|
| gptkbp:enables |
debugging
device programming in-circuit testing |
| gptkbp:firstPublished |
1990
|
| gptkbp:focusesOn |
boundary scan
test access port |
| gptkbp:publishedBy |
gptkb:Institute_of_Electrical_and_Electronics_Engineers
|
| gptkbp:relatedStandard |
gptkb:IEEE_1149.4
gptkb:IEEE_1149.6 gptkb:IEEE_1149.7 |
| gptkbp:specifies |
gptkb:Data_Register
gptkb:TAP_controller gptkb:Test_Access_Port_(TAP) gptkb:Boundary-Scan_Register gptkb:Instruction_Register |
| gptkbp:standardNumber |
gptkb:IEEE_1149.1
|
| gptkbp:updated |
2001
2013 2018 |
| gptkbp:usedFor |
testing integrated circuits
testing printed circuit boards |
| gptkbp:bfsParent |
gptkb:IEEE_1149.1
|
| gptkbp:bfsLayer |
4
|
| http://www.w3.org/2000/01/rdf-schema#label |
IEEE Standard Test Access Port and Boundary-Scan Architecture
|