Statements (115)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:standard
|
| gptkbp:bfsLayer |
5
|
| gptkbp:bfsParent |
gptkb:Core_Sight
|
| gptkbp:allows |
chip-level testing
|
| gptkbp:applies_to |
Automotive electronics
Digital Integrated Circuits |
| gptkbp:benefits |
Cost reduction
|
| gptkbp:defines |
instruction register
Boundary scan architecture |
| gptkbp:developed_by |
gptkb:API
|
| gptkbp:enables |
in-circuit testing
Testing of circuit boards system-level testing |
| gptkbp:enhances |
Fault isolation
manufacturing test efficiency |
| gptkbp:facilitates |
Interconnect testing
interconnect testing |
| https://www.w3.org/2000/01/rdf-schema#label |
IEEE 1149.1
|
| gptkbp:improves |
fault detection
|
| gptkbp:includes |
Instruction register
boundary scan register |
| gptkbp:is_adopted_by |
Research institutions
Startups Embedded systems Electronics industry semiconductor manufacturers system integrators contract manufacturers PCB manufacturers |
| gptkbp:is_compatible_with |
multiple device types
JTAG |
| gptkbp:is_critical_for |
gptkb:Company
Quality assurance complex systems Failure analysis high volume production high reliability systems low-power designs high-speed designs |
| gptkbp:is_essential_for |
Product reliability
System validation Time-to-market |
| gptkbp:is_implemented_in |
gptkb:football_match
gptkb:API Test engineers boundary scan controller test access controller |
| gptkbp:is_influential_in |
Product lifecycle management
Circuit design methodologies Test engineering practices |
| gptkbp:is_integrated_with |
Simulation tools
Debugging interfaces Test management systems |
| gptkbp:is_known_for |
JTAG
|
| gptkbp:is_often_used_in |
electronics industry
|
| gptkbp:is_part_of |
gptkb:IEEE_1149_family
Testing frameworks Testing standards Quality control processes test strategy Embedded system design Design for testability (DFT) techniques Test methodology design for test (DFT) methodologies |
| gptkbp:is_recognized_by |
Certification bodies
International standards organizations |
| gptkbp:is_recognized_for |
Test efficiency
|
| gptkbp:is_referenced_in |
Other IEEE standards
|
| gptkbp:is_related_to |
gptkb:IEEE_1149.7
Debugging techniques Boundary Scan Test access protocols IEEE 1149.6 |
| gptkbp:is_standardized_by |
gptkb:IEEE_Standards_Association
|
| gptkbp:is_supported_by |
gptkb:software
gptkb:Research_Institute Industry standards Software tools |
| gptkbp:is_used_for |
debugging
repair verification diagnostics Design verification Signal integrity testing boundary scan testing |
| gptkbp:is_used_in |
gptkb:Telecommunications_company
Consumer electronics Smart devices automotive applications consumer electronics military applications aerospace applications Aerospace applications Manufacturing testing |
| gptkbp:is_utilized_in |
Medical devices
Industrial automation Prototype testing Field testing Automated test equipment |
| gptkbp:key |
Product development
System integration System performance System on Chip (So C) testing |
| gptkbp:provides |
gptkb:Test_Access_Port_(TAP)
test access port (TAP) |
| gptkbp:provides_access_to |
Internal nodes
Test logic internal nodes |
| gptkbp:published_by |
gptkb:1990
|
| gptkbp:reduces |
test costs
|
| gptkbp:specifies |
Test data register
test data register |
| gptkbp:supports |
Debugging
In-system programming device programming |