Joint Test Action Group standard
GPTKB entity
Statements (29)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:electronic_testing_standard
|
| gptkbp:abbreviation |
gptkb:JTAG
|
| gptkbp:appliesTo |
integrated circuits
printed circuit boards |
| gptkbp:category |
gptkb:standard
electronics hardware testing |
| gptkbp:defines |
boundary-scan architecture
|
| gptkbp:formalStandard |
gptkb:IEEE_1149.1
|
| gptkbp:fullName |
gptkb:Joint_Test_Action_Group_standard
|
| gptkbp:hasFeature |
gptkb:Test_Access_Port_(TAP)
serial communication boundary scan register |
| gptkbp:hasPINCode |
gptkb:TCK
gptkb:TDI gptkb:TDO gptkb:TMS gptkb:TRST |
| gptkbp:introducedIn |
1990
|
| gptkbp:publishedBy |
gptkb:IEEE
|
| gptkbp:relatedStandard |
gptkb:IEEE_1149.6
gptkb:IEEE_1149.7 gptkb:IEEE_1532 |
| gptkbp:usedFor |
debugging
testing programming devices |
| gptkbp:bfsParent |
gptkb:JTAG_standard
|
| gptkbp:bfsLayer |
7
|
| https://www.w3.org/2000/01/rdf-schema#label |
Joint Test Action Group standard
|