Statements (30)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:electronic_test_standard
|
| gptkbp:alsoKnownAs |
gptkb:IEEE_1149.1
|
| gptkbp:appliesTo |
integrated circuits
printed circuit boards |
| gptkbp:category |
gptkb:debugger
gptkb:electronic_design_automation hardware testing |
| gptkbp:defines |
gptkb:TAP_controller
gptkb:Test_Access_Port_(TAP) gptkb:Boundary-scan_register Instruction register Data register |
| gptkbp:firstPublished |
1990
|
| gptkbp:fullName |
gptkb:Joint_Test_Action_Group_standard
|
| gptkbp:hasPINCode |
gptkb:TCK
gptkb:TDI gptkb:TDO gptkb:TMS gptkb:TRST |
| gptkbp:publishedBy |
gptkb:IEEE
|
| gptkbp:purpose |
test access port and boundary-scan architecture
|
| gptkbp:relatedStandard |
gptkb:IEEE_1149.4
gptkb:IEEE_1149.6 gptkb:IEEE_1532 |
| gptkbp:usedFor |
hardware debugging
in-system programming boundary scan testing |
| gptkbp:bfsParent |
gptkb:Joint_Test_Action_Group
|
| gptkbp:bfsLayer |
6
|
| https://www.w3.org/2000/01/rdf-schema#label |
JTAG standard
|