Properties (57)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:Research_Institute
|
| gptkbp:allows |
High-resolution imaging
|
| gptkbp:hasDepartment |
Sample thickness
Sample charging Beam damage |
| https://www.w3.org/2000/01/rdf-schema#label |
Electron Microscopy
|
| gptkbp:includes |
gptkb:Scanning_Transmission_Electron_Microscopy_(STEM)
gptkb:Transmission_Electron_Microscopy_(TEM) gptkb:Scanning_Electron_Microscopy_(SEM) |
| gptkbp:is_studied_in |
gptkb:Quantum_dots
Biomaterials Ceramics Polymers Metals Magnetic properties Composite materials Nanostructures Mechanical properties Thin films Surface morphology Electrical properties Nanoparticles Graphene Optical properties Defects in materials Biological specimens Nanotubes Thermal properties Cell structures Phase contrast Thin films of biomaterials Thin films of ceramics Thin films of composites Thin films of metals Thin films of nanocomposites Thin films of nanostructured ceramics Thin films of nanostructured materials Thin films of nanostructured metals Thin films of nanostructured oxides Thin films of nanostructured polymers Thin films of nanostructures Thin films of oxides Thin films of polymers Thin films of semiconductors Chemical_composition Crystalline_materials |
| gptkbp:is_used_in |
Biology
Materials science Nanotechnology Semiconductor inspection |
| gptkbp:mayHave |
Internal structures
Surface structures |
| gptkbp:produces |
Ernst Ruska
|
| gptkbp:provides |
3D imaging capabilities
|
| gptkbp:requires |
Sample preparation
Vacuum environment |
| gptkbp:uses |
Electron beams
|