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gptkbp:instanceOf
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Imaging Technique
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gptkbp:abbreviation
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gptkb:EM
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gptkbp:awardReceived
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gptkb:Nobel_Prize_in_Physics_1986
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gptkbp:cannotImage
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Living Cells
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gptkbp:contrastsWith
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gptkb:Light_Microscopy
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gptkbp:detects
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gptkb:Electrons
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gptkbp:enables
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gptkb:Crystallography
Cellular Ultrastructure Study
Failure Analysis
Nanoparticle Analysis
Protein Structure Determination
Surface Topography
Virus Imaging
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gptkbp:hasComponent
|
detector
Electromagnetic Lenses
Electron Gun
Vacuum Chamber
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gptkbp:hasType
|
gptkb:Cryo-Electron_Microscopy
gptkb:Scanning_Electron_Microscopy
gptkb:Transmission_Electron_Microscopy
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https://www.w3.org/2000/01/rdf-schema#label
|
Electron Microscopy
|
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gptkbp:introducedIn
|
1931
|
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gptkbp:inventedBy
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gptkb:Ernst_Ruska
|
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gptkbp:limitation
|
High Cost
Complex Preparation
Sample Damage
|
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gptkbp:provides
|
Elemental Analysis
Structural Information
|
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gptkbp:publishedIn
|
gptkb:Journal_of_Electron_Microscopy
gptkb:Microscopy_and_Microanalysis
gptkb:Ultramicroscopy
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gptkbp:regulates
|
Radiation Safety Guidelines
|
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gptkbp:relatedTo
|
gptkb:Atomic_Force_Microscopy
gptkb:X-ray_Microscopy
|
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gptkbp:requires
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gptkb:vacuum
Sample Preparation
|
|
gptkbp:resolution
|
Sub-nanometer
Up to 10,000,000x
|
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gptkbp:targetUser
|
Biologist
Materials Scientist
Microscopist
Nanotechnologist
|
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gptkbp:usedFor
|
High-Resolution Imaging
|
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gptkbp:usedIn
|
Materials Science
Biology
Nanotechnology
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gptkbp:uses
|
Electron Beam
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gptkbp:bfsParent
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gptkb:Orbital_Angular_Momentum
|
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gptkbp:bfsLayer
|
6
|