Transmission Electron Microscopy
GPTKB entity
Statements (37)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Microscopy technique
|
| gptkbp:abbreviation |
gptkb:TEM
|
| gptkbp:analyzes |
crystallographer
viruses cell organelles defects in materials |
| gptkbp:awarded |
Nobel Prize in Physics 1986 (to Ernst Ruska)
|
| gptkbp:category |
Imaging technology
Analytical technique Biological research tool Materials science tool |
| gptkbp:developedBy |
1930s
|
| https://www.w3.org/2000/01/rdf-schema#label |
Transmission Electron Microscopy
|
| gptkbp:inventedBy |
gptkb:Ernst_Ruska
|
| gptkbp:operatesIn |
high vacuum
|
| gptkbp:powerSource |
high voltage electrons
|
| gptkbp:relatedTo |
gptkb:Cryo-Electron_Microscopy
gptkb:Scanning_Electron_Microscopy |
| gptkbp:requires |
gptkb:electron_gun
electromagnetic lenses ultra-thin samples |
| gptkbp:resolution |
sub-nanometer
up to 2 million times |
| gptkbp:samplePreparation |
embedding
staining sectioning |
| gptkbp:sensorType |
photographic film
CCD camera fluorescent screen |
| gptkbp:usedFor |
material characterization
imaging at nanometer scale biological specimen analysis |
| gptkbp:uses |
electron beam
|
| gptkbp:bfsParent |
gptkb:Grain_Boundaries_in_Metals
gptkb:Electron_Microscopy gptkb:Cryo-Electron_Microscopy |
| gptkbp:bfsLayer |
7
|