electron microscope

GPTKB entity

Statements (161)
Predicate Object
gptkbp:instanceOf gptkb:electron_microscope
scientific instrument
Microscope
gptkbp:abbreviation gptkb:TEM
gptkb:SEM
gptkbp:advantage high resolution
detailed internal structure imaging
detailed surface imaging
high magnification
gptkbp:alternativeName Transmission_Electron_Microscope
microscope
scanning_electron_microscope
transmission_electron_microscope
gptkbp:application gptkb:Crystallography
Metallurgy
Polymer science
Cell ultrastructure analysis
Nanoparticle characterization
Semiconductor analysis
Virus identification
gptkbp:awarded Nobel Prize in Physics 1986 (Ernst Ruska)
gptkbp:canBe gptkb:field_emission_SEM
gptkb:variable_pressure_SEM
energy-dispersive X-ray spectroscopy
backscattered electron detector
conventional SEM
environmental SEM
secondary electron detector
gptkbp:cannotImage living cells
gptkbp:category gptkb:research_institute
electron microscopy
medical imaging technique
gptkbp:cause charging effects
sample damage
gptkbp:component gptkb:photographer
gptkb:electron_gun
condenser lens
fluorescent screen
objective lens
Vacuum system
Objective lens
Projector lens
Electron gun
Camera system
Condenser lens
Fluorescent screen
Specimen holder
gptkbp:contrastsWith gptkb:light_microscope
gptkbp:detects transmitted electrons
Transmitted electrons
gptkbp:distinctFrom gptkb:electron_microscope
Scanning Electron Microscope
gptkbp:field gptkb:nanotechnology
biology
geology
materials science
semiconductor industry
forensics
gptkbp:hasApplication cell biology
metallurgy
virology
forensics
nanomaterials analysis
gptkbp:hasComponent gptkb:electron_gun
detector
vacuum chamber
condenser lens
electromagnetic lenses
fluorescent screen
objective lens
specimen holder
sample stage
gptkbp:hasType gptkb:reflection_electron_microscope
gptkb:electron_microscope
scanning transmission electron microscope
https://www.w3.org/2000/01/rdf-schema#label electron microscope
gptkbp:introducedIn 1931
gptkbp:inventedBy gptkb:Ernst_Ruska
gptkb:Manfred_von_Ardenne
gptkb:Max_Knoll
1931
1937
gptkbp:limitation expensive
cannot image color
limited field of view
requires skilled operator
sample damage possible
Sample must be thin
Sample must withstand vacuum
gptkbp:magnificationRange up to 10,000,000x
10x to 1,000,000x
Up to 10,000,000x
gptkbp:obtainedFrom Atomic resolution
gptkbp:operatesIn gptkb:vacuum
high voltage
gptkbp:produces high-resolution images
3D surface images
elemental maps
gptkbp:provides greater resolution than light microscope
gptkbp:relatedTo gptkb:focused_ion_beam
gptkb:electron_microscope
X-ray microscope
optical microscope
Atomic force microscope
Light microscope
gptkbp:requires gptkb:vacuum
vibration isolation
high voltage power supply
electromagnetic lenses
electron source
trained operator
Skilled operator
vacuum environment
cooling system
sample preparation
operator training
conductive samples
sample mounting
ultra-thin samples
Vibration isolation
High voltage power supply
Ultrathin samples
gptkbp:resolution less than 1 nanometer
sub-nanometer
up to 1 nanometer
up to 2 million times
Less than 1 nanometer
gptkbp:samplePreparation musical composition
requires dehydration
requires staining
requires thin sectioning
coating with gold or carbon
Staining with heavy metals
gptkbp:signature black and white
crystals
viruses
nanoparticles
internal structure of cells
2D image
gptkbp:subspecies Analytical TEM
Cryo-TEM
High-resolution TEM
Scanning Transmission Electron Microscope
gptkbp:type Electron microscope
gptkbp:usedFor material analysis
nanotechnology research
Biological research
high-resolution imaging
biological studies
imaging at nanometer scale
imaging surfaces
Imaging at nanometer scale
Material science research
gptkbp:usedIn gptkb:nanotechnology
biology
materials science
semiconductor industry
gptkbp:uses electron beam
Electron beam
gptkbp:bfsParent gptkb:Ernst_Ruska
gptkbp:bfsLayer 4