Kelvin Probe Force Microscopy
GPTKB entity
Statements (32)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
scanning probe microscopy technique
|
| gptkbp:abbreviation |
KPFM
|
| gptkbp:application |
graphene research
battery research organic electronics solar cells thin film analysis corrosion studies |
| gptkbp:basedOn |
gptkb:atomic_force_microscopy
|
| gptkbp:category |
microscopy
surface analysis |
| gptkbp:detects |
electrostatic forces
surface charge distribution |
| gptkbp:enables |
mapping of surface potential
mapping of work function variations |
| https://www.w3.org/2000/01/rdf-schema#label |
Kelvin Probe Force Microscopy
|
| gptkbp:inventedBy |
1991
Nonnenmacher, O'Boyle, and Wickramasinghe |
| gptkbp:measures |
contact potential difference
work function |
| gptkbp:operatesIn |
gptkb:vacuum
ambient conditions |
| gptkbp:relatedTo |
gptkb:Kelvin_probe
gptkb:atomic_force_microscopy |
| gptkbp:resolution |
nanometer scale
|
| gptkbp:usedIn |
surface science
material science semiconductor research |
| gptkbp:uses |
conductive AFM tip
|
| gptkbp:bfsParent |
gptkb:SKPM
gptkb:Atomic_Force_Microscope |
| gptkbp:bfsLayer |
7
|