Statements (23)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
analytical technique
|
| gptkbp:alsoKnownAs |
gptkb:Kelvin_Probe_Force_Microscopy
|
| gptkbp:basedOn |
gptkb:atomic_force_microscopy
|
| gptkbp:detects |
electrostatic forces
|
| gptkbp:enables |
work function mapping of surfaces
|
| gptkbp:fullName |
gptkb:Scanning_Kelvin_Probe_Microscopy
|
| https://www.w3.org/2000/01/rdf-schema#label |
SKPM
|
| gptkbp:inventedBy |
Lord Kelvin (principle)
|
| gptkbp:measures |
contact potential difference
|
| gptkbp:operatesIn |
gptkb:vacuum
ambient conditions controlled atmosphere |
| gptkbp:provides |
nanoscale resolution
|
| gptkbp:relatedTo |
gptkb:Kelvin_probe
gptkb:atomic_force_microscopy |
| gptkbp:requires |
conductive AFM tip
|
| gptkbp:usedFor |
mapping work function
measuring surface potential |
| gptkbp:usedIn |
materials science
surface science semiconductor research |
| gptkbp:bfsParent |
gptkb:scanning_Kelvin_probe_microscopy
|
| gptkbp:bfsLayer |
6
|