Scanning Kelvin Probe Microscopy
GPTKB entity
Statements (25)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
analytical technique
|
| gptkbp:alsoKnownAs |
gptkb:SKPM
gptkb:Kelvin_Probe_Force_Microscopy |
| gptkbp:appliesTo |
metals
semiconductors organic materials conductive samples |
| gptkbp:basedOn |
gptkb:atomic_force_microscopy
|
| gptkbp:detects |
surface charge distribution
|
| gptkbp:developedBy |
1990s
|
| gptkbp:enables |
nanoscale electrical characterization
|
| https://www.w3.org/2000/01/rdf-schema#label |
Scanning Kelvin Probe Microscopy
|
| gptkbp:measures |
contact potential difference
|
| gptkbp:provides |
work function mapping
|
| gptkbp:relatedTo |
gptkb:Kelvin_probe
gptkb:atomic_force_microscopy |
| gptkbp:requires |
conductive AFM tip
|
| gptkbp:usedFor |
measuring surface potential
mapping work function variations |
| gptkbp:usedIn |
gptkb:nanotechnology
materials science surface science semiconductor research |
| gptkbp:bfsParent |
gptkb:SKPM
|
| gptkbp:bfsLayer |
7
|