scanning Kelvin probe microscopy
GPTKB entity
Statements (23)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
analytical technique
|
| gptkbp:alsoKnownAs |
gptkb:SKPM
|
| gptkbp:basedOn |
gptkb:atomic_force_microscopy
|
| gptkbp:canBe |
gptkb:vacuum
ambient conditions controlled atmosphere |
| gptkbp:detects |
electrostatic forces
|
| https://www.w3.org/2000/01/rdf-schema#label |
scanning Kelvin probe microscopy
|
| gptkbp:inventedBy |
1990s
|
| gptkbp:measures |
contact potential difference
local work function variations |
| gptkbp:relatedTo |
gptkb:Kelvin_probe
gptkb:scanning_probe_microscopy |
| gptkbp:requires |
conductive tip
|
| gptkbp:resolution |
nanometer scale
|
| gptkbp:usedFor |
mapping work function
measuring surface potential |
| gptkbp:usedIn |
materials science
surface science semiconductor research |
| gptkbp:uses |
vibrating tip
|
| gptkbp:bfsParent |
gptkb:Kelvin_probe
|
| gptkbp:bfsLayer |
5
|