Statements (49)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
microscopy technique
|
| gptkbp:abbreviation |
gptkb:AFM
|
| gptkbp:advantage |
minimal sample preparation
high resolution operates in various environments |
| gptkbp:alternativeTo |
electron microscopy
|
| gptkbp:application |
gptkb:nanotechnology
biology materials science semiconductor industry polymer science |
| gptkbp:commercializedSince |
late 1980s
|
| gptkbp:compatibleWith |
vacuum (in some modes)
|
| gptkbp:detects |
deflection of cantilever
laser beam deflection |
| gptkbp:enables |
3D surface profiling
force spectroscopy manipulation of atoms |
| https://www.w3.org/2000/01/rdf-schema#label |
atomic force microscopy
|
| gptkbp:introducedIn |
1986
|
| gptkbp:inventedBy |
gptkb:Gerd_Binnig
gptkb:Calvin_Quate gptkb:Christoph_Gerber |
| gptkbp:limitation |
limited scan size
sample damage (in contact mode) slow scan speed tip wear |
| gptkbp:measures |
electrical properties
magnetic properties topography mechanical properties |
| gptkbp:mode |
contact mode
non-contact mode tapping mode |
| gptkbp:operatesIn |
gptkb:vacuum
ambient air liquid environments |
| gptkbp:relatedTo |
gptkb:scanning_tunneling_microscopy
gptkb:scanning_probe_microscopy |
| gptkbp:resolution |
atomic scale
sub-nanometer |
| gptkbp:signature |
insulators
conductors biological samples |
| gptkbp:usedFor |
imaging surfaces at the nanoscale
measuring forces between tip and sample |
| gptkbp:uses |
cantilever with sharp tip
|
| gptkbp:bfsParent |
gptkb:scanning_tunneling_microscopy
|
| gptkbp:bfsLayer |
5
|