Joint Test Action Group interface
GPTKB entity
Statements (26)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:electronic_interface_standard
|
| gptkbp:abbreviation |
gptkb:JTAG
|
| gptkbp:category |
gptkb:personal_computer
gptkb:industrial_equipment gptkb:electronic_design_automation |
| gptkbp:enables |
hardware debugging
in-system programming device configuration |
| gptkbp:hasPINCode |
gptkb:TCK
gptkb:TDI gptkb:TDO gptkb:TMS gptkb:TRST |
| gptkbp:introducedIn |
1985
|
| gptkbp:relatedStandard |
gptkb:IEEE_1149.7
gptkb:IEEE_1532 |
| gptkbp:standardizedBy |
gptkb:IEEE_1149.1
|
| gptkbp:supports |
boundary scan
|
| gptkbp:usedFor |
debugging integrated circuits
testing printed circuit boards |
| gptkbp:usedIn |
microcontrollers
ASICs FPGAs |
| gptkbp:bfsParent |
gptkb:JTAG_interface
|
| gptkbp:bfsLayer |
6
|
| https://www.w3.org/2000/01/rdf-schema#label |
Joint Test Action Group interface
|