Statements (48)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
electronic test interface
|
| gptkbp:dataRate |
typically up to 100 MHz
|
| gptkbp:fullName |
gptkb:Joint_Test_Action_Group_interface
|
| gptkbp:hasFeature |
data register
instruction register state machine test access port (TAP) |
| gptkbp:hasPINCode |
gptkb:TCK
gptkb:TDI gptkb:TDO gptkb:TMS gptkb:TRST |
| https://www.w3.org/2000/01/rdf-schema#label |
JTAG interface
|
| gptkbp:introducedIn |
1985
|
| gptkbp:relatedStandard |
gptkb:IEEE_1149.7
gptkb:IEEE_1532 |
| gptkbp:standardizedBy |
gptkb:IEEE_1149.1
|
| gptkbp:supports |
daisy chaining
|
| gptkbp:supportsProtocol |
serial communication
|
| gptkbp:usedBy |
gptkb:microprocessor
FPGA ASIC |
| gptkbp:usedFor |
diagnostics
security features boundary scan debugging embedded systems fault isolation hardware debugging hardware verification firmware updates device programming programming microcontrollers testing printed circuit boards board bring-up chain integrity checking chip configuration chip identification embedded instrumentation flash programming in-circuit debugging logic analysis production testing signal monitoring system-level test testing interconnects testing logic devices |
| gptkbp:bfsParent |
gptkb:IEEE_1532
|
| gptkbp:bfsLayer |
5
|