Statements (19)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:alsoKnownAs |
gptkb:JTAG_family
|
| gptkbp:application |
testing integrated circuits
debugging electronic systems |
| gptkbp:developedBy |
gptkb:IEEE
|
| gptkbp:field |
boundary scan
electronic test |
| gptkbp:firstStandardYear |
1990
|
| gptkbp:hasFeature |
gptkb:IEEE_1149.1
gptkb:IEEE_1149.8.1 gptkb:IEEE_1149.4 gptkb:IEEE_1149.6 gptkb:IEEE_1149.7 |
| https://www.w3.org/2000/01/rdf-schema#label |
IEEE 1149 family
|
| gptkbp:purpose |
test access port and boundary scan architecture
|
| gptkbp:bfsParent |
gptkb:IEEE_1149.4
gptkb:IEEE_1149.6 gptkb:IEEE_1149.7 |
| gptkbp:bfsLayer |
5
|