Statements (20)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:appliesTo |
gptkb:MOSFETs
gptkb:IGBTs transistors diodes discrete semiconductors thyristors |
| gptkbp:documentType |
qualification standard
|
| gptkbp:focusesOn |
qualification requirements
reliability testing stress test methods |
| https://www.w3.org/2000/01/rdf-schema#label |
AEC-Q101 Rev H
|
| gptkbp:language |
English
|
| gptkbp:latestReleaseVersion |
2022-12
|
| gptkbp:publishedBy |
gptkb:Automotive_Electronics_Council
|
| gptkbp:replacedBy |
gptkb:AEC-Q101_Rev_G
|
| gptkbp:url |
https://www.aecouncil.com/documents/AEC-Q101.pdf
|
| gptkbp:usedIn |
automotive industry
|
| gptkbp:bfsParent |
gptkb:AEC-Q101
|
| gptkbp:bfsLayer |
6
|