Statements (21)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:appliesTo |
transistors
diodes discrete semiconductors thyristors |
| gptkbp:firstIssueDate |
1997
|
| gptkbp:fullName |
gptkb:Automotive_Electronics_Council_Q101
|
| https://www.w3.org/2000/01/rdf-schema#label |
AEC-Q101
|
| gptkbp:industry |
automotive
|
| gptkbp:issuedBy |
gptkb:Automotive_Electronics_Council
|
| gptkbp:latestReleaseVersion |
gptkb:AEC-Q101_Rev_H
2022 |
| gptkbp:purpose |
qualification of discrete semiconductors for automotive applications
|
| gptkbp:region |
global
|
| gptkbp:relatedStandard |
gptkb:AEC-Q100
gptkb:AEC-Q102 gptkb:AEC-Q200 |
| gptkbp:scope |
stress test qualification for discrete semiconductors
|
| gptkbp:website |
https://www.aecouncil.com/Automotive_Electronics_Council_Standards.html
|
| gptkbp:bfsParent |
gptkb:Automotive_Electronics_Council
|
| gptkbp:bfsLayer |
5
|