Statements (16)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:appliesTo |
automotive electronics
discrete semiconductors |
| gptkbp:documentType |
qualification standard
|
| gptkbp:focusesOn |
qualification requirements
|
| https://www.w3.org/2000/01/rdf-schema#label |
AEC-Q101 Rev G
|
| gptkbp:language |
English
|
| gptkbp:publishedBy |
gptkb:Automotive_Electronics_Council
|
| gptkbp:releaseDate |
2013
|
| gptkbp:replacedBy |
AEC-Q101 Rev F
|
| gptkbp:scope |
stress test qualification for discrete semiconductors
|
| gptkbp:status |
active
|
| gptkbp:usedBy |
automotive industry
semiconductor manufacturers |
| gptkbp:bfsParent |
gptkb:AEC-Q101_Rev_H
|
| gptkbp:bfsLayer |
7
|