Statements (36)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:analytical_technique
gptkb:X-ray_fluorescence_method |
| gptkbp:advantage |
rapid analysis
low background noise simultaneous multi-element analysis |
| gptkbp:application |
semiconductor industry
material science environmental analysis food analysis pharmaceutical analysis biological samples |
| gptkbp:excitationSource |
gptkb:X-rays
|
| gptkbp:feature |
high sensitivity
minimal sample preparation non-destructive analysis multi-element detection low detection limits requires small sample amounts uses total reflection of X-rays |
| gptkbp:inventedBy |
1970s
|
| gptkbp:limitation |
matrix effects
requires flat sample support |
| gptkbp:principle |
gptkb:X-ray_fluorescence
|
| gptkbp:relatedTo |
gptkb:energy-dispersive_XRF
gptkb:wavelength-dispersive_XRF gptkb:X-ray_fluorescence_spectroscopy |
| gptkbp:samplePreparation |
sample deposited on flat carrier
|
| gptkbp:sensorType |
energy-dispersive detector
|
| gptkbp:type |
liquid samples
solid samples |
| gptkbp:usedFor |
quantitative analysis
elemental analysis trace element detection |
| gptkbp:bfsParent |
gptkb:X-ray_fluorescence
|
| gptkbp:bfsLayer |
7
|
| https://www.w3.org/2000/01/rdf-schema#label |
total reflection XRF (TXRF)
|