Statements (103)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:physical_phenomenon
|
| gptkbp:advantage |
minimal sample preparation
rapid analysis multi-element detection |
| gptkbp:alsoKnownAs |
gptkb:XRF
|
| gptkbp:analyzes |
liquid samples
powder samples solid samples |
| gptkbp:causedBy |
excitation of material by high-energy X-rays or gamma rays
|
| gptkbp:compatibleWith |
gptkb:helium
gptkb:neon carbon hydrogen nitrogen oxygen boron lithium beryllium fluorine sodium (with some exceptions) |
| gptkbp:detects |
elements with atomic number above 11 (sodium)
|
| gptkbp:discoveredBy |
gptkb:Charles_Glover_Barkla
|
| gptkbp:discoveredIn |
1906
|
| gptkbp:hasType |
gptkb:benchtop_XRF
gptkb:confocal_XRF gptkb:field_XRF gptkb:handheld_XRF gptkb:high-resolution_XRF gptkb:imaging_XRF gptkb:in-situ_XRF gptkb:laboratory_XRF gptkb:macro_XRF gptkb:microbeam_XRF gptkb:off-line_XRF gptkb:on-line_XRF gptkb:polarized_XRF gptkb:synchrotron_XRF gptkb:tabletop_XRF gptkb:total_reflection_XRF_(TXRF) angle-resolved XRF atmospheric XRF automated XRF bulk XRF cryogenic XRF depth profiling XRF energy-dispersive X-ray fluorescence (EDXRF) high-energy XRF high-throughput XRF industrial XRF low-energy XRF mapping XRF micro-XRF portable XRF pressure-controlled XRF qualitative XRF quantitative XRF robotic XRF semi-quantitative XRF surface XRF temperature-controlled XRF time-resolved XRF vacuum XRF wavelength-dispersive X-ray fluorescence (WDXRF) |
| gptkbp:involves |
emission of characteristic secondary X-rays
|
| gptkbp:limitation |
limited sensitivity for light elements
matrix effects requires calibration standards surface sensitivity |
| gptkbp:measures |
elemental composition
|
| gptkbp:nonDestructive |
true
|
| gptkbp:regulates |
gptkb:ASTM_E121
gptkb:ASTM_E1621 gptkb:ASTM_E2119 gptkb:ASTM_E2465 gptkb:ASTM_E322 gptkb:ASTM_E572 gptkb:ISO_3497 |
| gptkbp:relatedTo |
gptkb:Auger_electron_spectroscopy
gptkb:X-ray_absorption_spectroscopy gptkb:X-ray_spectroscopy energy-dispersive X-ray spectroscopy wavelength-dispersive X-ray spectroscopy |
| gptkbp:requires |
gptkb:X-ray_source
gptkb:detector |
| gptkbp:usedFor |
chemical analysis
elemental analysis |
| gptkbp:usedIn |
archaeology
environmental science geology metallurgy mining material science cement industry forensics petroleum industry art conservation |
| gptkbp:bfsParent |
gptkb:X-Ray_Spectrometer_(XRS)
gptkb:Chemistry_and_Mineralogy_(CheMin) gptkb:Auger_effect gptkb:Archaeometry gptkb:Shimadzu_Corporation |
| gptkbp:bfsLayer |
6
|
| https://www.w3.org/2000/01/rdf-schema#label |
X-ray fluorescence
|