X-ray fluorescence spectroscopy
GPTKB entity
Statements (49)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
analytical technique
|
| gptkbp:advantage |
minimal sample preparation
rapid analysis |
| gptkbp:alsoKnownAs |
gptkb:XRF
|
| gptkbp:alternativeName |
X-ray_spectrometer
|
| gptkbp:analyzes |
trace elements
major elements minor elements |
| gptkbp:appliesTo |
liquids
solids powders |
| gptkbp:basedOn |
gptkb:X-ray_fluorescence
|
| gptkbp:canBe |
portable
non-destructive qualitative quantitative benchtop in situ ex situ laboratory-based |
| gptkbp:detects |
characteristic X-rays
secondary X-rays |
| gptkbp:developedBy |
20th century
|
| gptkbp:inventedBy |
gptkb:Hevesy_György
|
| gptkbp:limitation |
limited sensitivity for light elements
matrix effects |
| gptkbp:measures |
elemental composition
concentration of elements |
| gptkbp:regulates |
gptkb:ASTM_E1621
gptkb:ISO_3497 |
| gptkbp:relatedTo |
energy-dispersive X-ray spectroscopy
wavelength-dispersive X-ray spectroscopy |
| gptkbp:requires |
detector
X-ray source calibration standards |
| gptkbp:usedFor |
quality control
chemical analysis forensic analysis industrial process control elemental analysis |
| gptkbp:usedIn |
archaeology
environmental science geology metallurgy material science art conservation |
| gptkbp:uses |
primary X-ray beam
|
| gptkbp:bfsParent |
gptkb:spectrometer
|
| gptkbp:bfsLayer |
5
|