X-ray Photoelectron Spectroscopy

URI: https://gptkb.org/entity/X-ray_Photoelectron_Spectroscopy
GPTKB entity
Statements (57)
Predicate Object
gptkbp:instanceOf gptkb:analytical_technique
gptkb:surface_analysis_method
gptkbp:abbreviation gptkb:XPS
gptkbp:alsoKnownAs gptkb:ESCA
gptkbp:analyzes top 1-10 nm of material surface
gptkbp:awarded gptkb:Nobel_Prize_in_Physics_1981_(to_Kai_Siegbahn)
gptkbp:detects all elements except hydrogen and helium
gptkbp:fullName gptkb:X-ray_Photoelectron_Spectroscopy
gptkbp:introducedIn 1950s
gptkbp:inventedBy gptkb:Kai_Siegbahn
gptkbp:limitation cannot detect helium
cannot detect hydrogen
charging effects in insulators
requires vacuum
sample must be solid
surface sensitive only
gptkbp:measures binding energy of electrons
kinetic energy of photoelectrons
gptkbp:non-destructive yes
gptkbp:output XPS spectrum
binding energy peaks
gptkbp:provides gptkb:empirical_formula
elemental composition
chemical state of elements
electronic state of elements
thickness of thin films
gptkbp:publishedIn scientific journals
gptkbp:quantitative yes
gptkbp:relatedTo gptkb:Auger_Electron_Spectroscopy
gptkb:Photoelectron_Spectroscopy
gptkb:Secondary_Ion_Mass_Spectrometry
gptkb:X-ray_Fluorescence
gptkbp:requires ultra-high vacuum
gptkbp:standardizedBy gptkb:ASTM_E1523
gptkb:ISO_15472
gptkbp:type gptkb:stone
gptkb:thin_film
powder
gptkbp:usedFor chemical analysis
elemental analysis
surface composition analysis
chemical state analysis
gptkbp:usedIn gptkb:nanotechnology
biomaterials
chemistry
materials science
physics
semiconductor industry
polymers
surface engineering
catalysis research
thin film analysis
corrosion studies
gptkbp:uses gptkb:X-rays
gptkbp:bfsParent gptkb:Angle-Resolved_Photoemission_Spectroscopy
gptkbp:bfsLayer 6
https://www.w3.org/2000/01/rdf-schema#label X-ray Photoelectron Spectroscopy