|
gptkbp:instanceOf
|
physical phenomenon
analytical technique
|
|
gptkbp:advantage
|
minimal sample preparation
non-destructive
rapid analysis
|
|
gptkbp:alternativeName
|
gptkb:XRF
|
|
gptkbp:detects
|
energy-dispersive
wavelength-dispersive
|
|
gptkbp:discoveredBy
|
gptkb:Charles_Glover_Barkla
|
|
gptkbp:discoveredIn
|
1909
|
|
gptkbp:excitationSource
|
primary X-rays
|
|
https://www.w3.org/2000/01/rdf-schema#label
|
X-ray Fluorescence
|
|
gptkbp:instrument
|
XRF spectrometer
|
|
gptkbp:ISOStandard
|
gptkb:ISO_3497
ISO 12677
|
|
gptkbp:limitation
|
limited sensitivity for light elements
matrix effects
|
|
gptkbp:principle
|
emission of characteristic secondary X-rays from a material
|
|
gptkbp:relatedTo
|
gptkb:Auger_effect
gptkb:X-ray_emission_spectroscopy
gptkb:X-ray_spectroscopy
|
|
gptkbp:type
|
liquids
solids
powders
|
|
gptkbp:usedFor
|
chemical analysis
elemental analysis
|
|
gptkbp:usedIn
|
archaeology
environmental science
geology
material science
|
|
gptkbp:wavelengthRange
|
X-ray region
|
|
gptkbp:bfsParent
|
gptkb:X-ray_Photoelectron_Spectroscopy
|
|
gptkbp:bfsLayer
|
7
|