Statements (62)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:Company
|
| gptkbp:acquisition |
gptkb:Camtek_Ltd.
gptkb:Nanometrics |
| gptkbp:awards |
Innovation Awards
Best in Industry Awards |
| gptkbp:ceo |
gptkb:Dr._David_L._H._Lee
gptkb:Michael_D._Plisinski Michael Plisinski |
| gptkbp:community_engagement |
Support for Local Education
Active in STEM Programs |
| gptkbp:competitors |
gptkb:Company
gptkb:ASML gptkb:Applied_Materials |
| gptkbp:customer_base |
Top Semiconductor Manufacturers
|
| gptkbp:customer_support |
24/7 Technical Support
Global Support Network |
| gptkbp:employees |
Approximately 1,000
|
| gptkbp:financial_products |
Publicly Traded
|
| gptkbp:focus |
Advanced Packaging
Wafer Inspection Yield Management |
| gptkbp:founded |
gptkb:2019
|
| gptkbp:global_presence |
Offices Worldwide
|
| gptkbp:headcount |
Growing Workforce
|
| gptkbp:headquarters |
gptkb:Wilmington,_Massachusetts
|
| gptkbp:historical_event |
Founded from merger of Nanometrics and Rudolph Technologies
|
| https://www.w3.org/2000/01/rdf-schema#label |
Onto Innovation
|
| gptkbp:industry |
Semiconductor Equipment
|
| gptkbp:invention |
Numerous in Inspection
Numerous in Metrology |
| gptkbp:investment |
Institutional Investors
Retail Investors |
| gptkbp:key_people |
Michael Plisinski
|
| gptkbp:market |
Global
|
| gptkbp:market_cap |
Approximately $1 billion
|
| gptkbp:mission |
Delivering Innovative Solutions
|
| gptkbp:parent_company |
gptkb:None
|
| gptkbp:partnerships |
Research Institutions
Collaboration with Universities Various Semiconductor Manufacturers Joint Ventures in Technology Development |
| gptkbp:product_line |
Inspection Equipment
Metrology Equipment Software Solutions for Semiconductor Manufacturing |
| gptkbp:products |
Inspection Systems
Metrology Systems |
| gptkbp:research_and_development |
Strong Investment
|
| gptkbp:research_focus |
AI in Semiconductor Manufacturing
Next-Generation Semiconductor Technologies |
| gptkbp:revenue |
$300 million (2022)
|
| gptkbp:services |
gptkb:software
Process Control Solutions |
| gptkbp:stock_exchange |
gptkb:NASDAQ
|
| gptkbp:sustainability |
Commitment to Sustainability
|
| gptkbp:symbol |
ONTO
|
| gptkbp:traded_on |
gptkb:NASDAQ
|
| gptkbp:training |
Technical Training
Employee Development Programs |
| gptkbp:vision |
Leading in Semiconductor Metrology
|
| gptkbp:website |
www.ontoinnovation.com
|
| gptkbp:bfsParent |
gptkb:Rudolph_Technologies_Japan
|
| gptkbp:bfsLayer |
5
|