Statements (23)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:CEO |
gptkb:Michael_P._Plisinski
|
| gptkbp:formedByMergerOf |
gptkb:Rudolph_Technologies
gptkb:Nanometrics |
| gptkbp:founded |
2019
|
| gptkbp:headquartersLocation |
gptkb:Wilmington,_Massachusetts,_United_States
|
| https://www.w3.org/2000/01/rdf-schema#label |
Onto Innovation
|
| gptkbp:industry |
semiconductor equipment
|
| gptkbp:numberOfEmployees |
over 1000
|
| gptkbp:products |
software solutions
inspection systems metrology equipment |
| gptkbp:servesArea |
worldwide
|
| gptkbp:specializesIn |
process control
wafer metrology advanced packaging inspection yield management |
| gptkbp:stockExchange |
gptkb:S&P_SmallCap_600
gptkb:Russell_2000 |
| gptkbp:tradedOn |
gptkb:NYSE:_ONTO
|
| gptkbp:website |
https://www.ontoinnovation.com/
|
| gptkbp:bfsParent |
gptkb:KLA_Corporation
|
| gptkbp:bfsLayer |
6
|