Statements (21)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:public_company
|
| gptkbp:CEO |
gptkb:Michael_P._Plisinski
|
| gptkbp:country |
gptkb:United_States
|
| gptkbp:CUSIP |
683344105
|
| gptkbp:formedByMergerOf |
gptkb:Rudolph_Technologies
Nanometrics Incorporated |
| gptkbp:founded |
2019
|
| gptkbp:hasCompany |
Onto Innovation Inc.
|
| gptkbp:headquartersLocation |
gptkb:Wilmington,_Massachusetts,_USA
|
| https://www.w3.org/2000/01/rdf-schema#label |
NYSE: ONTO
|
| gptkbp:industry |
semiconductor equipment
|
| gptkbp:ISIN |
US6833441057
|
| gptkbp:listedOn |
gptkb:New_York_Stock_Exchange
|
| gptkbp:products |
inspection systems
process control metrology equipment software for semiconductor manufacturing |
| gptkbp:sector |
gptkb:technology
|
| gptkbp:stockSymbol |
gptkb:ONTO
|
| gptkbp:website |
https://www.ontoinnovation.com/
|
| gptkbp:bfsParent |
gptkb:Onto_Innovation
|
| gptkbp:bfsLayer |
7
|