Statements (19)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:defunct |
2019
|
| gptkbp:founded |
1940
|
| gptkbp:headquartersLocation |
gptkb:Wilmington,_Massachusetts,_United_States
|
| https://www.w3.org/2000/01/rdf-schema#label |
Rudolph Technologies
|
| gptkbp:industry |
semiconductor equipment
|
| gptkbp:keyPerson |
gptkb:Michael_P._Plisinski
Steven R. Roth |
| gptkbp:mergedInto |
Nanometrics Incorporated
|
| gptkbp:products |
inspection systems
metrology equipment process control software |
| gptkbp:publiclyTraded |
NYSE:RTEC
|
| gptkbp:status |
defunct
|
| gptkbp:successor |
gptkb:Onto_Innovation
|
| gptkbp:website |
https://www.rudolphtech.com/
|
| gptkbp:bfsParent |
gptkb:Onto_Innovation
gptkb:Nanometrics |
| gptkbp:bfsLayer |
7
|