Properties (51)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:Company
|
| gptkbp:acquisition |
Nanometrics Incorporated
Rudolph_Technologies_acquired_by_Nanometrics |
| gptkbp:awards |
Industry Awards
Best Places to Work |
| gptkbp:CEO |
gptkb:Paul_F._McLaughlin
|
| gptkbp:customerBase |
Top Semiconductor Companies
|
| gptkbp:employees |
Approximately 500
|
| gptkbp:focus |
Process Control
Advanced Packaging Wafer Inspection Yield Management Thin Film Measurement |
| gptkbp:founded |
1976
|
| gptkbp:founder |
Rudolph_L._(Rudy)_H._K._Wong
|
| gptkbp:headCoach |
500+
|
| gptkbp:headquarters |
gptkb:Flanders,_New_Jersey
|
| gptkbp:history |
Founded in 1976
Publicly traded since 1997 Acquired_by_Nanometrics_in_2020 |
| https://www.w3.org/2000/01/rdf-schema#label |
Rudolph Technologies
|
| gptkbp:industry |
Semiconductor Equipment
|
| gptkbp:location |
gptkb:United_States
|
| gptkbp:market |
gptkb:Global_Semiconductor_Market
|
| gptkbp:mission |
Deliver Quality Solutions
Enhance Yield Improve Process Control |
| gptkbp:partnerships |
Various Semiconductor Manufacturers
|
| gptkbp:products |
Inspection Equipment
Metrology Equipment |
| gptkbp:research |
Product Development
Customer Solutions Innovative_Technologies |
| gptkbp:revenue |
$100 million (2020)
|
| gptkbp:services |
Software Solutions
Support Services |
| gptkbp:stockSymbol |
RTEC
|
| gptkbp:subsidiary |
gptkb:Rudolph_Technologies_Japan
|
| gptkbp:technology |
Image Processing
Optical Metrology Software_Algorithms Laser_Scanning |
| gptkbp:values |
Collaboration
Innovation Integrity Excellence Customer Focus |
| gptkbp:vision |
Customer-Centric Approach
Innovative_Technology_Leader Leading_Metrology_Solutions_Provider |
| gptkbp:website |
www.rudolphtech.com
|