Statements (27)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:acquiredBy |
gptkb:Nanometrics
gptkb:Orbotech gptkb:Therma-Wave |
| gptkbp:CEO |
gptkb:Rick_Wallace
|
| gptkbp:founded |
1975
|
| gptkbp:founder |
gptkb:Ken_Levy
gptkb:Bob_Anderson |
| gptkbp:headquartersLocation |
gptkb:Milpitas,_California,_United_States
|
| gptkbp:industry |
semiconductor equipment
|
| gptkbp:mergedInto |
gptkb:Tencor_Instruments
1997 |
| gptkbp:numberOfEmployees |
~15,000 (2023)
|
| gptkbp:parentCompany |
gptkb:KLA_Corporation
|
| gptkbp:product |
process control systems
inspection systems metrology equipment |
| gptkbp:revenue |
$10.5 billion (2023)
|
| gptkbp:stockSymbol |
gptkb:NASDAQ
gptkb:KLAC |
| gptkbp:tradedOn |
gptkb:NASDAQ
|
| gptkbp:website |
https://www.kla.com/
|
| gptkbp:bfsParent |
gptkb:Migdal_HaEmek
gptkb:KLA gptkb:KLA_Corporation |
| gptkbp:bfsLayer |
6
|
| http://www.w3.org/2000/01/rdf-schema#label |
KLA-Tencor
|