Statements (15)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:acquiredBy |
gptkb:KLA-Tencor
|
| gptkbp:acquisitionYear |
2007
|
| gptkbp:focus |
thin film measurement
ion implant metrology wafer metrology |
| gptkbp:foundedYear |
1982
|
| gptkbp:headquartersLocation |
gptkb:Fremont,_California,_United_States
|
| https://www.w3.org/2000/01/rdf-schema#label |
Therma-Wave
|
| gptkbp:industry |
semiconductor equipment
|
| gptkbp:product |
process control systems
metrology equipment |
| gptkbp:bfsParent |
gptkb:KLA
gptkb:KLA_Corporation |
| gptkbp:bfsLayer |
6
|