Properties (62)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:Company
|
| gptkbp:acquisition |
gptkb:KLA_Corporation
|
| gptkbp:awards |
Innovation Award
Best Supplier Award Excellence in Engineering Award |
| gptkbp:competitors |
gptkb:Lam_Research
gptkb:ASML gptkb:Hitachi_High-Technologies gptkb:Nikon_Corporation Applied Materials |
| gptkbp:employees |
Approximately 1,000
|
| gptkbp:founded |
1970
|
| gptkbp:founder |
gptkb:Dr._R._Scott_McGregor
|
| gptkbp:headquarters |
gptkb:Milpitas,_California
|
| https://www.w3.org/2000/01/rdf-schema#label |
Tencor Instruments
|
| gptkbp:industry |
Semiconductor Equipment
|
| gptkbp:keyPeople |
gptkb:Richard_P._(Rick)_Wallace
gptkb:John_M._(Jack)_McCarthy gptkb:Kurt_K._Kauffman gptkb:Dr._R._Scott_McGregor gptkb:David_L._(Dave)_Huber |
| gptkbp:market |
Global
|
| gptkbp:partnerships |
Research Institutions
Technology Developers Various Semiconductor Manufacturers |
| gptkbp:products |
Inspection_Systems
Metrology_Systems Defect_Review_Systems |
| gptkbp:services |
Data Analysis
Process Control Yield Management |
| gptkbp:subsidiary |
gptkb:KLA-Tencor_Taiwan
gptkb:KLA-Tencor_Japan gptkb:KLA-Tencor_Europe gptkb:KLA-Tencor_China |
| gptkbp:technology |
gptkb:Atomic_Force_Microscopy
Automation Solutions Integration Solutions Scanning Electron Microscopy Optical Metrology Defect Inspection Wafer Inspection Nanotechnology Solutions 3D Metrology Critical Dimension Measurement Failure Analysis Solutions Film Thickness Measurement Metrology Software Overlay Measurement X-ray Metrology Data_Analytics_Tools Quality_Control_Solutions Process_Control_Solutions Yield_Management_Solutions Advanced_Packaging_Solutions EUV_Lithography_Solutions MEMS_Metrology_Solutions Optical_Inspection_Solutions Process_Development_Solutions Reliability_Testing_Solutions Surface_Profilometry |
| gptkbp:website |
www.kla.com/tencor
|