Statements (14)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:foundedIn |
gptkb:United_States
|
| gptkbp:foundedYear |
1976
|
| gptkbp:headquartersLocation |
gptkb:Milpitas,_California
|
| https://www.w3.org/2000/01/rdf-schema#label |
Tencor Instruments
|
| gptkbp:industry |
semiconductor equipment
|
| gptkbp:mergedInto |
gptkb:KLA_Corporation
1997 |
| gptkbp:notableProduct |
metrology equipment
wafer inspection systems |
| gptkbp:successor |
gptkb:KLA-Tencor
|
| gptkbp:bfsParent |
gptkb:KLA
gptkb:KLA_Corporation |
| gptkbp:bfsLayer |
6
|