Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:Company
|
| gptkbp:acquired_by |
gptkb:Corporation
|
| gptkbp:founded |
gptkb:1970
|
| gptkbp:founder |
gptkb:Dr._R._Scott_Mc_Gregor
|
| gptkbp:headquarters |
gptkb:Milpitas,_California
|
| https://www.w3.org/2000/01/rdf-schema#label |
Tencor Instruments
|
| gptkbp:industry |
Semiconductor Equipment
|
| gptkbp:products |
Inspection Systems
Metrology Systems Yield Management Solutions |
| gptkbp:website |
www.kla.com/tencor
|
| gptkbp:bfsParent |
gptkb:Tengu
|
| gptkbp:bfsLayer |
5
|