JEM series electron microscopes
GPTKB entity
Statements (31)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
electron microscope series
|
| gptkbp:application |
gptkb:cryo-EM
electron diffraction high-resolution imaging elemental analysis |
| gptkbp:countryOfOrigin |
gptkb:Japan
|
| https://www.w3.org/2000/01/rdf-schema#label |
JEM series electron microscopes
|
| gptkbp:introduced |
gptkb:JEOL
|
| gptkbp:introducedIn |
1949
|
| gptkbp:manufacturer |
gptkb:JEOL
|
| gptkbp:marketedAs |
1950s
|
| gptkbp:notableModel |
gptkb:JEM-100
gptkb:JEM-1010 gptkb:JEM-1400 gptkb:JEM-2100 gptkb:JEM-ARM200F |
| gptkbp:notableUser |
research institutes
universities industrial laboratories |
| gptkbp:parentCompany |
gptkb:JEOL_Ltd.
|
| gptkbp:productType |
gptkb:electron_microscope
|
| gptkbp:relatedOrganization |
gptkb:Hitachi
gptkb:FEI_Company |
| gptkbp:technology |
cryo-electron microscopy
transmission electron microscopy scanning transmission electron microscopy |
| gptkbp:usedIn |
gptkb:nanotechnology
biology materials science |
| gptkbp:bfsParent |
gptkb:JEOL
|
| gptkbp:bfsLayer |
7
|