Statements (15)
Predicate | Object |
---|---|
gptkbp:instanceOf |
gptkb:electron_microscope
|
gptkbp:abbreviation |
Atomic Resolution Microscope 200F
|
gptkbp:application |
gptkb:nanotechnology
crystallography materials science |
gptkbp:feature |
high spatial resolution
aberration corrector analytical capabilities |
https://www.w3.org/2000/01/rdf-schema#label |
JEM-ARM200F
|
gptkbp:manufacturer |
gptkb:JEOL
|
gptkbp:maximum_accelerating_voltage |
200 kV
|
gptkbp:resolution |
sub-angstrom
|
gptkbp:type |
scanning transmission electron microscope
|
gptkbp:bfsParent |
gptkb:JEM_series_electron_microscopes
|
gptkbp:bfsLayer |
8
|