JEM-ARM200F

GPTKB entity

Statements (15)
Predicate Object
gptkbp:instanceOf gptkb:electron_microscope
gptkbp:abbreviation Atomic Resolution Microscope 200F
gptkbp:application gptkb:nanotechnology
crystallography
materials science
gptkbp:feature high spatial resolution
aberration corrector
analytical capabilities
https://www.w3.org/2000/01/rdf-schema#label JEM-ARM200F
gptkbp:manufacturer gptkb:JEOL
gptkbp:maximum_accelerating_voltage 200 kV
gptkbp:resolution sub-angstrom
gptkbp:type scanning transmission electron microscope
gptkbp:bfsParent gptkb:JEM_series_electron_microscopes
gptkbp:bfsLayer 8