Statements (15)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:electron_microscope
|
| gptkbp:abbreviation |
Atomic Resolution Microscope 200F
|
| gptkbp:application |
gptkb:nanotechnology
crystallography materials science |
| gptkbp:feature |
high spatial resolution
aberration corrector analytical capabilities |
| gptkbp:manufacturer |
gptkb:JEOL
|
| gptkbp:maximum_accelerating_voltage |
200 kV
|
| gptkbp:resolution |
sub-angstrom
|
| gptkbp:type |
gptkb:scanning_transmission_electron_microscope
|
| gptkbp:bfsParent |
gptkb:JEM_series_electron_microscopes
|
| gptkbp:bfsLayer |
8
|
| http://www.w3.org/2000/01/rdf-schema#label |
JEM-ARM200F
|