IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
GPTKB entity
Statements (22)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:International_Standard
|
| gptkbp:alsoKnownAs |
gptkb:JTAG
|
| gptkbp:appliesTo |
integrated circuits
digital networks |
| gptkbp:category |
electronic design automation
test engineering |
| gptkbp:defines |
gptkb:Test_Access_Port_(TAP)
gptkb:Boundary-scan_register Instruction register Test data registers |
| gptkbp:field |
digital circuits
electronic testing |
| gptkbp:firstPublished |
1990
|
| https://www.w3.org/2000/01/rdf-schema#label |
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
|
| gptkbp:publishedBy |
gptkb:Institute_of_Electrical_and_Electronics_Engineers
|
| gptkbp:purpose |
facilitate testing of interconnects on printed circuit boards
|
| gptkbp:standardNumber |
gptkb:IEEE_1149.1
|
| gptkbp:usedFor |
device testing
hardware debugging in-system programming |
| gptkbp:bfsParent |
gptkb:IEEE_1149.6
|
| gptkbp:bfsLayer |
5
|