Statements (15)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:International_Standard
test bus architecture |
| gptkbp:alsoKnownAs |
gptkb:IEEE_1149.4
|
| gptkbp:developedBy |
gptkb:IEEE
|
| gptkbp:enables |
boundary scan for mixed-signal devices
|
| https://www.w3.org/2000/01/rdf-schema#label |
Mixed-Signal Test Bus
|
| gptkbp:introducedIn |
1999
|
| gptkbp:provides |
test access to analog nodes
test access to digital nodes |
| gptkbp:relatedTo |
gptkb:IEEE_1149.1
|
| gptkbp:standardNumber |
gptkb:IEEE_1149.4
|
| gptkbp:usedFor |
analog and digital circuit testing
testing mixed-signal integrated circuits |
| gptkbp:bfsParent |
gptkb:IEEE_1149.4
|
| gptkbp:bfsLayer |
5
|