Energy Dispersive Spectroscopy
GPTKB entity
Statements (49)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Analytical Technique
|
| gptkbp:abbreviation |
gptkb:EDS
gptkb:EDX EDAX |
| gptkbp:advantage |
Non-destructive
Rapid Analysis Simultaneous Multi-element Detection |
| gptkbp:alternativeName |
Energy Dispersive X-ray Spectroscopy
EDS Analysis |
| gptkbp:analyzes |
Powder Samples
Solid Samples Thin Films |
| gptkbp:basedOn |
Characteristic X-ray Emission
|
| gptkbp:detectorMaterial |
gptkb:Silicon_Drift_Detector
Lithium-drifted Silicon Detector |
| gptkbp:detects |
gptkb:X-rays
gptkb:Hydrogen gptkb:Lithium gptkb:Helium Beryllium Elements with Atomic Number > 4 |
| https://www.w3.org/2000/01/rdf-schema#label |
Energy Dispersive Spectroscopy
|
| gptkbp:inventedBy |
1960s
|
| gptkbp:limitation |
Detection Limits
Overlapping Peaks Spatial Resolution |
| gptkbp:measures |
Elemental Composition
|
| gptkbp:output |
Elemental Map
Line Scan X-ray Spectrum |
| gptkbp:provides |
Quantitative Analysis
Qualitative Analysis |
| gptkbp:relatedTo |
gptkb:Wavelength_Dispersive_Spectroscopy
gptkb:X-ray_Fluorescence |
| gptkbp:requires |
Electron Beam
Vacuum Environment |
| gptkbp:sensorType |
gptkb:Semiconductor_Detector
|
| gptkbp:usedFor |
gptkb:electron_microscope
Elemental Analysis Scanning Electron Microscope |
| gptkbp:usedIn |
gptkb:Electron_Microscopy
Materials Science Metallurgy Biology Geology Forensics Nanotechnology |
| gptkbp:bfsParent |
gptkb:Wavelength_Dispersive_Spectroscopy
|
| gptkbp:bfsLayer |
8
|